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PostDoc position (100%) and PhD position (75%) in the field of
- TEM School 2011: 4.-7.-10.2011. Application form. Deadline: 29th of july 2011.
The third TEM school will be organized for members of the EAM-participating groups as well as industry researchers and engineers. The goal of the course is to provide an overview of the most important techniques of transmission electron microscopy and to introduce the new cutting-edge TEM facilities that are now available at the Center for Nanoanalysis and Electron Microscopy (CENEM). As the number of participants is limited to 16, interested researchers are encouraged to apply for a place on the course by 29 July 2011. - Report about CENEM-Activities in winter edition of EAM-Newsletter
- 13.-18.3.2011: Symposium "New Developments in Transmission Electron Microscopy of Materials" at the DPG Frühjahrstagung
- October 5-8, 2010: 2. Erlangen TEM School. Registrate now! Deadline: September 15, 2010
- September 19-24, 2010: Symposium on "Composite and Self-Assembled Materials" at the International Microscopy Conference IMC17 in Rio de Janeiro.
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April 30, 2010: Inauguration of the Titan3 80-300 and its building
Fotosession at the Titan3 80-30 with the Staatsminister für Wissenschaft und Kunst Dr. Heubisch, the rector of the university Prof. Grüske, the coordinator of the excellence cluster EAM Prof. Peukert and the head of the electron microscopy group Prof. Spiecker.
Prof. Spiecker (left hand side) showed the new possibilities of the Titan380-300 and reported on first research results. The guest speaker Prof. Urban (right hand side) who was an important person for the development of the aberration correction, gave a short overview of the history of aberration correction and showed new research results of his group at the Forschungszentrum Jülich.
Three of Prof. Speaker's daughters enriched the inauguration ceremony with classical sounds.
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Paper Advantages of aberration correction for HRTEM investigation of complex layer compounds by E. Spiecker et al. chosen for cover image of the march issue of Journal of Microscopy
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March 1-2, 2010, International Symposium on "Disperse Systems for Electronics" with Session on High-Resolution Transmission Electron Microscopy (download flyer)
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1st Erlangen TEM-School from Oct. 12-15, 2009
In the first half of October the electron microscopy group organized a four-day intensive TEM school for members of the EAM-participating groups. The goal of the school was to provide an overview of the most important techniques of transmission electron microscopy and to introduce the new and exciting TEM opportunities that are now available at the university. PhD students and Postdocs from 16 different groups participated in the school which comprised morning lectures, exercises and practical work at the microscopes. Employing all three of the microscopes at the Cauerstrasse facility, a wide range of topics were covered, including electron diffraction, conventional TEM, high-resolution and analytical TEM. In addition, various techniques of TEM sample preparation were presented. As a highlight, the new aberration-corrected Titan3 80 – 300 microscope and its unique capabilities for atomic scale analysis of materials was demonstrated. Based on the overall interest in the school (There were twice as many interested applicants as there were spaces available!) as well as the positive response of the participants, plans to organize a second TEM school next year are already in full swing.
